X-ray Characterization of Solid Small Molecule Organic Materials

The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.

Attached files:
WO 2010141063.jpg

Patents:
WO 2,010,141,063

Inventor(s): BILLINGE SIMON [US]; SHANKLAND KENNETH [GB]; SHANKLAND NORMAN [GB]; FLORENCE ALASTAIR [GB]

Type of Offer: Licensing



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