Method and Apparatus for Measuring Microrelief of an Object

An apparatus for determining microrelief of an object periphery, comprising a ring for attachment to the object, a carriage adapted to traverse the ring; a non-contact measurement system mounted on the carriage; an advancement mechanism for incrementally advancing the carriage to a plurality of locations along the path; and a processor configured to receive and process an output of the measurement system. The processor determines a distance from the object periphery to the detector at each of the plurality of locations and automatically determines the microrelief of the object periphery from the measured distances. The apparatus and associated methods for determining microrelief may be particularly adapted to determine bark microrelief of trees, poles, pipes, or any other types of cylindrical objects.

Attached files:
WO 2010132794.jpg

Patents:
WO 2,010,132,794

Inventor(s): VAN STAN II JOHN TOLAND [US]; JARVIS MATTHEW T [US]; LEVIA JR DELPHIS F [US]

Type of Offer: Sale



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