Analysis System and Method

An analysis system has a sample region (1), a source of excitation radiation (3), and a wavelength-inspecific beam splitter (13) to deliver some of the excitation radiation to a sample. A dispersion element (2023) disperses returned radiation from the sample to be analysed that has been transmitted by the beam splitter. A selectively switchable micromirror device (2035) receives returned radiation that has been dispersed by the dispersion element. A detector (2043) detects radiation that is received from the switchable micromirror device. The switchable micromirror device removes at least a major part of residual excitation radiation from the returned radiation that is passed to the detector.; A method of quantifying target analyte(s) in a sample includes receiving radiation from a sample region for each of a plurality of points along at least part of the length of the sample region, and delivering at least some of the radiation to the detector.

Attached files:


Patents:
WO 2,009,082,242

Inventor(s): GREEN DAVID PETER LUSCOMB [NZ]; RAWLE CHRISTOPHER BRUCE [NZ]

Type of Offer: Sale



« More Physics Patents

---