Method and Apparatus for Measuring the Optical Forces Acting on a Particle

Apparatus and method for measuring the optical forces acting on a trapped particle. In one embodiment, the apparatus and method can be adapted for insertion in the optical train of an optical microscope configured to trap, with a single light beam, a particle suspended in a suspension medium, between the entry face and exit face of a chamber placed on or in the microscope. The apparatus and methods involve the use of a single system of collector lenses, the latter having a numerical aperture that is greater than or equal to the refraction index of the suspension medium for suspending the particle in the chamber, and being located near or in contact with the exit face of the suspension chamber. A light sensor device is placed in or near the rear focal plane of the collector lens, or in an optical equivalent thereof, the latter being capable, directly or indirectly, of producing measurements of the optical force acting on the particle, said measurements being taken from the x and y coordinates of the centres of mass of the distribution of light projected on the light sensor device by the collector lens.

Attached files:


Patents:
WO 2,010,130,852

Inventor(s): MONTES USATEGUI MARIO [ES]; FARRE FLAQUER ARNAU [ES]

Type of Offer: Sale



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