Enhanced Surface-selective Spectroscopy Using Broad-band Heterodyne-detected Sum Frequency Generation

Method and apparatus for performing spectroscopy, include the combining of first and second light beams to form a reference beam, focusing the first and second light beams and the reference beam onto a sample, receiving a reflected light beam from the sample at a monochromator, and viewing a predetermined wavelength band of the reflected light beam from the monochromator. Portions of the first and second light beams, which may be visible and IR forms of electromagnetic energy, are heterodyned through a crystal. A monochromator receives a reflection of the reference beam from the sample, and Fourier transformation is performed on the output of the monochromator. The first and second beams of electromagnetic energy can be split to form first and second component beams and the reference beam, all of which are propagated to the sample.

Attached files:
US 20100265501.jpg

Patents:
US 20,100,265,501

Inventor(s): BENDERSKII ALEXANDER V [US]; STIOPKIN IGOR V [US]; JAYATHILAKE HIMALI DILRUKSHI [US]

Type of Offer: Licensing



Next Patent »
« More Optical Science Patents

Share on      


CrowdSell Your Patent