Methods and System for On-chip Decoder for Array Test

The present invention provides devices capable of testing the electrical performance of thin- film transistor backplane arrays and methods for their use.

Patents:
WO 2,010,123,619

Inventor(s): BAWOLEK EDWARD J [US]; MOYER CURTIS D [US]; VENUGOPAL SAMEER M [US]

Type of Offer: Licensing



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