Methods and System for Electrostatic Discharge Protection of Thin-film Transistor Backplane Arrays

The present invention provides devices and methods for testing the electrical performance of thin- film transistor backplane arrays and protecting thin- films during testing and handling.

Attached files:
WO 2010123620.jpg

Patents:
WO 2,010,123,620

Inventor(s): BAWOLEK EDWARD J [US]; MOYER CURTIS D [US]; VENUGOPAL SAMEER M [US]

Type of Offer: Licensing



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