Methods and System for Electrostatic Discharge Protection of Thin-film Transistor Backplane Arrays
The present invention provides devices and methods for testing the electrical performance of thin- film transistor backplane arrays and protecting thin- films during testing and handling.
Attached files:Patents:WO 2,010,123,620
Inventor(s):
BAWOLEK EDWARD J [US]; MOYER CURTIS D [US]; VENUGOPAL SAMEER M [US]
Type of Offer:
Licensing
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