Apparatus and Method for the Detection of Forces in the Sub-micronewton Range

A force microscope (1) for the detection of forces in the sub-micronewton range has a measurement head (3) which is used to carry out a relative movement with respect to a sample holder (4) and to which a carrier molecule (9) is attached on which probe molecules (10) are placed.

Attached files:


Patents:
EP 2,115,423

Inventor(s): HUGEL THORSTEN [DE]; GEISLER MICHAEL [DE]

Type of Offer: Sale



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