Fabrication of Metamaterials

An example method of fabricating a metamaterial comprises providing a first metamaterial layer, the first metamaterial layer including a first plurality of conducting patterns, such as electrically coupled resonators. A second metamaterial layer is then formed, including a second plurality of conducting patterns, to form a multilayer metamaterial. Positional alignment of the first and second plurality of conducting patterns can be achieved relative to the same fiducial mark, which may be associated with the first metamaterial layer, for example supported by a first substrate or on an alignment layer that is attached to the first substrate.

Attached files:


Patents:
US 20,100,314,040

Inventor(s): TYLER II TALMAGE [US]; JOKERST NAN MARIE [US]; SMITH DAVID R [US]; NGUYEN VINH N [US]; KIM JUNGSANG [US]; YONAK SERDAR H [US]

Type of Offer: Licensing



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