Multi Stage Control Architecture for Error Suppression in Micromachined Gyroscopes

Background: In the past, for micromachined gyroscopes to operate with highest precision required characterization by the manufacturer followed with post processing such as laser trimming, ion beam milling or selective material deposition and integration of feedback control. This process is expensive and time consuming and contributes to additional costs of the sensor. Another disadvantage is this type of post processing is exclusively done by the manufacturer under ideal laboratory conditions. As a result, the end user is still required to calibrate the device prior to use and then no calibration is possible while the device is in use. While low cost sensors are available on the market, the low costs are attributed to a lack of post processing. As a result, these devices have poor long term performance due to drift, noise, and scaling errors. Technology: In contrast, The University's invention is the integration of self-calibration capabilities to identify non-idealities, active electronic "trimming" in the form of a feed-forward control, and feedback control for additional error suppression in a multi stage control architecture. With low costs and small sizes of existing microprocessors on the market, this type of control architecture can be built directly on the same chip as the device itself. Such a control architecture would significantly reduce the time and cost for sensor calibration and potentially improve long term performance by allowing for rapid in-run diagnostics. Where conventional devices required calibration prior to being used in an application, this control architecture would allow the device to periodically re-calibrate itself to operate with optimal performance. Application: Such a device would be beneficial in all inertial sensor applications where high performance is desirable, while preserving the low-cost advantage of MEMS batch fabrication. The control architecture can be integrated on the same chip as the device, thereby reducing costs. Additionally, the control would allow for periodic in-run calibration of the device to allow optimal performance.

Patents:
US 6,934,660

Type of Offer: Licensing



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