Energy Nano-probe

This invention includes techniques for the fabrication and utilization of a high resolution probe capable of detecting the variation of the energy states of sample being scanned. The probe is a scanning energy probe in radiative mode (SEP-R) consisting of an AFM/STM tip appropriately modified into an Organic Light Emitting Diode (OLED) to enable the transfer of light to a sample.Current NSOM techniques for achieving high-resolution optical probing have several limitations that have prevented them from being applied to 1) sensitive samples which may degrade under high temperature or background illumination and 2) samples for which intense background illumination washes out the desired signal. This probe overcomes these current issues and enables nanoscale characterization.Applications include optical microscopy of nanoscale structures and processes in electronic, biologic, organic or hybrid systems

Inventor(s): Max Shtein,Kevin Pipe

Type of Offer: Licensing



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