Apparatus for the Absolute Measurement of Two Dimensional Optical Path Distributions Using Interferometry

An apparatus for the absolute measurement of a two dimensional optical path distribution comprising: a light source (4) for illuminating an object (26) with light having a plurality of wavelengths: an interferometer (12) for forming an image of at least part of the object, which image comprises a broad band interferogram; a hyperspectral imager (30) in optical communication with the interferometer for spectrally separating the broad band interferogram into a plurality of narrow band two dimensional interf erograms (72, 74, 76); a register (38) for spatially registering the narrow band interf erograms; an extractor for extracting one dimensional intensity signals from corresponding pixels in each narrow band interferogram; and a calculator (100) for calculating the frequency for each point on the object from a one dimensional intensity signal associated with that point.

Attached files:


Patents:
WO 2,011,010,092

Inventor(s): HUNTLEY JONATHAN MARK [GB]; RUIZ PABLO DANIEL [GB]; WIDJANARKO TAUFIQ [GB]

Type of Offer: Sale



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