Don Rohner

Photolithographic exposure system and method employing a liquid crystal display
(LCD) panel as a configurable mask
Patent number: 6097361 Issued: August 1, 2000 Assignee: Advanced Micro Devices, Inc.

Apparatus and method for semiconductor wafer processing which facilitate
determination of a source of contaminants or defects
Patent number: 6073501 Issued: June 13, 2000 Assignee: Advanced Micro Devices, Inc.

Black body reference for RTA
Patent number: 5988874 Issued: November 23, 1999 Assignee: Advanced Micro Devices, Inc.

Method for consistently forming low resistance contact structures involving the removal
of adhesion layer particles blocking via openings
Patent number: 5980979 Issued: November 9, 1999 Assignee: Advanced Micro Devices, Inc.
Inventor: Don R. Rohner
Apparatus for selectively exposing a semiconductor topography to an electric field
Patent number: 5948219 Issued: September 7, 1999 Assignee: Advanced Micro Devices, Inc.

Method for monitoring the performance of an ion implanter using reusable wafers
Patent number: 5861632 Issued: January 19, 1999 Assignee: Advanced Micro Devices, Inc.

Process for patterning metal connections in small-geometry semiconductor structures
Patent number: 5225040 Issued: July 6, 1993 Assignee: Raytheon Company