The Unit for Nanoscopic Characterization


Develop and operate user-oriented analytical facilities Aid researchers from the University and external customers in performing a variety of characterization measurements Support multidisciplinary research and "hands-on" technological education at The Hebrew University Services provided

The unit provides advanced equipment for:
Electron microscopy, scanning probe microscopy, X-ray characterization, and advanced surface-chemical analysis of materials. The UNC also provides equipment needed for specimen preparation for the above-mentioned characterization facilities. A highly-qualified, experienced staff is available to assist with all projects Training courses for users who wish to learn how to use and operate the facilities of the unit Advantages

Fully equipped with state-of-the-art instruments, staffed by experienced, service-oriented professionals Available equipment

Transmission Electron Microscope - Tecnai F20 G2 (TEM)
High-Resolution Scanning Electron Microscope - Sirion (HR-SEM)
Environmental Scanning Electron Microscope - QUANTA 200(ESEM)
X-Ray Diffractometer - D8 Advance (XRD)
Scanning Probe Microscope - Nanoscope Dimension 3100 (SPM)
X-Ray Photoelectron and Auger Spectroscope - Axis Ultra (XPS & Auger) Staff

The unit maintains a staff of engineers, research fellows, a technical manager and a technical engineer

Type of Offer: Licensing

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