Small Scale Solid State Screening

The present invention relates to screening of solid material. In particular the present invention relates to an apparatus and a method for screening of crystalline or amorphous material during secondary manufacturing. Accordingly the invention relates to a method for solid state screening by simulating secondary manufacturing of at least one solid material; wherein said solid state screening combines small scale crystallization in a receptacle and the evaluation of induced solid state changes in said receptacle, allowing crystallization and simulated secondary manufacturing to be performed simultaneously or consecutively; and wherein said secondary manufacturing comprises applying at least one of the conditions of strain, stress, and/or shear forces.

Attached files:


Patents:
WO 2,009,059,605

Inventor(s): RANTANEN JUKKA [DK]; ALLESOE MORTEN [DK]; CORNETT CLAUS [DK]

Type of Offer: Sale



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