System and Method for Performing Microscopy with Light Exhibiting an Orbital Angular Momentum

A microscopy system is provided comprising a light source for generating a first light beam, a sample area for accommodating a sample to be examined, a detector for detecting a second light beam generated by the sample in response to the first light beam and an optical assembly for focusing the first light beam on the sample area and for focusing the second light beam on the detector. The light source is arranged for generating the first light beam with an orbital angular momentum. The system may comprise a sample with one or more helical structures, for example collagen molecular structures. The scattering process will be more efficient when the characteristics of the first light beam match the characteristics of the molecular structures in the sample. By changing the orbital angular momentum of the first light beam, the pitch and the handedness of its wave front may be adjusted in order to match these characteristics of the sample.

Patents:
WO 2,011,028,109

Inventor(s): T HOOFT GERT WIM [NL]; LUCASSEN GERHARDUS WILHELMUS [NL]; WOERDMAN JOHANNES PETRUS [NL]

Type of Offer: Sale



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