Platform for Metrology Instruments and Use Thereof

The invention relates to a platform for metrology instruments, comprising a base and an upper plate that rotates on the base by means of rolling spheres, as well as kinematic couplings for anchoring the upper plate in pre-determined positions and sensors for obtaining highly precise measurements of said positions. The invention is intended to be used with portable measuring instruments and to perform verification or calibration operations on said portable instruments.

Patents:
ES 2,356,219

Inventor(s): AGUILAR MARTIN JUAN JOSE; SANTOLARIA MAZO JORGE

Type of Offer: Sale



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