High Frequency Analysis of a Device Under Test

Analyzing a device under test ("DUT") at higher frequencies. A phase shifter varies the phase of a standing wave on a transmission line coupled to the DUT. The standing wave magnitude is sampled at each of the phase shifts and one or more DUT characteristics are determined as a function of the sampled magnitudes and phase shifts. Further aspects include a related phase shifter comprising a waveguide having a plurality of sub-resonant slots formed therein and having active elements for loading the slots to control the phase shift applied to the signal.

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Patents:
WO 2,010,083,152

Inventor(s): ABOUKHOUSA MOHAMED AHMED [US]; ZOUGHI REZA [US]; KHARKIVSKIY SERGIY [US]

Type of Offer: Licensing



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