Jones phase microscopy of transparent samples

Methods for displaying anisotropic properties of an object. The object is illuminated with a first test beam characterized by a first polarization that, after traversing the object, is combined with a reference beam. The combined light of the first transmitted test beam and the reference beam is analyzed by a first pair of polarization analyzers, and interference created between the first transmitted test beam and the reference beam as analyzed by the first pair of analyzers is detected to derive intensity, phase and polarization of the first transmitted test beam. The same is then done with a second test beam that has a polarization with a component orthogonal to the first polarization.; Based on the two analyzed beams, complex elements of a Jones matrix associated with the object in a local coordinate system are determined and a plurality of tangible images are displayed that characterize the object based on the complex elements of the Jones matrix.

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Patents:
US 20,100,027,027

Inventor(s): POPESCU GABRIEL [US]; WANG ZHUO [US]

Type of Offer: Licensing



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