Apparatus and Method for the Detection of Forces in the Sub-micronewton Range
A force microscope (1) for the detection of forces in the sub-micronewton range has a measurement head (3) which is used to carry out a relative movement with respect to a sample holder (4) and to which a carrier molecule (9) is attached on which probe molecules (10) are placed.
Attached files:Patents:EP 2,115,423
Inventor(s):
HUGEL THORSTEN [DE]; GEISLER MICHAEL [DE]
Type of Offer:
Sale
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