Method of Detecting, Characterizing, and Quantifying Bulk, Light-Element Materials Using High-Energy, Penetrating X-Rays

Introduction X-rays have long been used in the characterization of a wide variety of materials. However, conventional techniques for dealing with light-element (or low-Z) materials, such as those containing nitrogen and carbon, are too low in energy to penetrate significant distances into enclosing material or into the bulk of the material of interest. A higher energy technique is required to solve this problem. Technology Description Researcher Elam at the University of Washington has developed the methodology to utilize non-resonant inelastic X-ray scattering (NRIXS) for the detection, characterization, and quantification of materials composed of light (or low-Z) elements, including boron, carbon, nitrogen, and oxygen. The X-rays used in this technique have sufficient energy to penetrate enclosing materials and the bulk of the material of interest. Business Opportunity The ability to easily detect, characterize, and quantify light elements, such as carbon and nitrogen, in bulky and blocked materials presents opportunities for the field detection of a variety of non-metallic compounds. Key among these compounds are explosives, which consist primarily of these elements and may be encased in material that would block other techniques. Environmental sensing and ceramics characterization are additional areas presenting possible applications. Stage of Development A working methodology has been developed and characterized. Intellectual Property Position The UW is currently reviewing this technology for worldwide patent protection. For more information on this technology contact:
Kelly FitzGerald, PhD Technology Manager, Invention Licensing kafg@u.washington.edu 206-543-3970

Type of Offer: Licensing



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